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STM32L151VD Datasheet(PDF) 59 Page - STMicroelectronics

Part # STM32L151VD
Description  Ultra-low-power 32-bit MCU ARM-based Cortex-M3, 384KB Flash
PDF  140 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32L151VD Datasheet(HTML) 59 Page - STMicroelectronics

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STM32L151xD STM32L152xD
Electrical characteristics
Doc ID 022027 Rev 6
59/140
6.3.3
Embedded internal reference voltage
The parameters given in Table 16 are based on characterization results, unless otherwise
specified.
Table 16.
Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT out
(1)
Internal reference voltage
– 40 °C < TJ < +105 °C
1.202
1.224
1.242
V
IREFINT
Internal reference current
consumption
-1.4
2.3
µA
TVREFINT
Internal reference startup time
-
2
3
ms
VVREF_MEAS
VDDA and VREF+ voltage during
VREFINT factory measure
2.99
3
3.01
V
AVREF_MEAS
Accuracy of factory-measured
VREF value
(2)
Including uncertainties
due to ADC and
VDDA/VREF+ values
--
±5
mV
TCoeff
(3)
Temperature coefficient
–40 °C < TJ < +105 °C
-
20
50
ppm/°C
0 °C < TJ < +50 °C
-
-
20
ACoeff
(3)
Long-term stability
1000 hours, T= 25 °C
-
-
1000
ppm
VDDCoeff(3)
Voltage coefficient
3.0 V < VDDA < 3.6 V
-
-
2000
ppm/V
TS_vrefint
(3)(4)
ADC sampling time when
reading the internal reference
voltage
-
5
10
µs
TADC_BUF
(3)
Startup time of reference voltage
buffer for ADC
-
-
10
µs
IBUF_ADC
(3)
Consumption of reference
voltage buffer for ADC
-13.5
25
µA
IVREF_OUT
(3)
VREF_OUT output current(5)
--
1
µA
CVREF_OUT
(3)
VREF_OUT output load
-
-
50
pF
ILPBUF
(3)
Consumption of reference
voltage buffer for VREF_OUT
and COMP
-
730
1200
nA
VREFINT_DIV1
(3)
1/4 reference voltage
24
25
26
%
VREFINT
VREFINT_DIV2
(3)
1/2 reference voltage
49
50
51
VREFINT_DIV3
(3)
3/4 reference voltage
74
75
76
1.
Tested in production.
2.
The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes.
3.
Guaranteed by design, not tested in production.
4.
Shortest sampling time can be determined in the application by multiple iterations.
5.
To guarantee less than 1% VREF_OUT deviation.



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