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STM32L151VD Datasheet(PDF) 97 Page - STMicroelectronics

Part # STM32L151VD
Description  Ultra-low-power 32-bit MCU ARM-based Cortex-M3, 384KB Flash
PDF  140 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32L151VD Datasheet(HTML) 97 Page - STMicroelectronics

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STM32L151xD STM32L152xD
Electrical characteristics
Doc ID 022027 Rev 6
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6.3.13
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 50 are derived from tests
performed under the conditions summarized in Table 14. All I/Os are CMOS and TTL
compliant.
Table 50.
I/O static characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIL
Input low level voltage
TTL ports
2.7 V
VDD3.6 V
VSS - 0.3
-
0.8
V
VIH
Standard I/O input high level voltage
2(1)
-VDD+0.3
FT(2) I/O input high level voltage
-
5.5V
VIL
Input low level voltage
CMOS ports
1.65 V
VDD3.6 V
–0.3
-
0.3VDD
(3)
VIH
Standard I/O Input high level voltage
CMOS ports
1.65 V
VDD3.6 V
0.7 VDD
(3)(4)
-VDD+0.3
FT(5) I/O input high level voltage
CMOS ports
1.65 V
VDD2.0 V
-5.25
CMOS ports
2.0 V
VDD3.6 V
-5.5
Vhys
Standard I/O Schmitt trigger voltage
hysteresis(6)
10% VDD
(7)
--
Ilkg
Input leakage current (8)(3)
VSS VIN VDD
I/Os with LCD
--
±50
nA
VSS VIN VDD
I/Os with analog
switches
--
±50
VSS VIN VDD
I/Os with analog
switches and LCD
--
±50
VSS VIN VDD
I/Os with USB
--
TBD
VSS VIN VDD
Standard I/Os
--
±50
RPU
Weak pull-up equivalent resistor(9)(3)
VIN = VSS
30
45
60
k
Ω
RPD
Weak pull-down equivalent resistor(9)(3)
VIN = VDD
30
45
60
k
Ω
CIO
I/O pin capacitance
-
5
-
pF
1.
Guaranteed by design.
2.
FT = 5V tolerant. To sustain a voltage higher than VDD +0.5 the internal pull-up/pull-down resistors must be disabled.
3.
Tested in production
4.
0.7VDD for 5V-tolerant receiver
5.
FT = Five-volt tolerant.
6.
Hysteresis voltage between Schmitt trigger switching levels. Based on characterization, not tested in production.
7.
With a minimum of 200 mV. Based on characterization, not tested in production.



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