MCP660 datasheet(6/68 Pages) MICROCHIP

6 / 68 page

MCP660/1/2/3/4/5/9

DS20002194E-page 6

 2009-2014 Microchip Technology Inc.

1.3

Timing Diagram

FIGURE 1-1:

Timing Diagram.

1.4

Test Circuits

The circuit used for most DC and AC tests is shown in

Figure 1-2. This circuit can independently set VCM and

VOUT; see Equation 1-1. Note that VCM is not the

circuit’s common-mode voltage ((VP +VM)/2) and that

VOST includes VOS plus the effects (on the input offset

error, VOST) of temperature, CMRR, PSRR and AOL.

EQUATION 1-1:

FIGURE 1-2:

AC and DC Test Circuit for

Most Specifications.

VOUT

ISS

ICS

-1 µA

High Z

1µA

-6 mA

-1 µA

tON

tOFF

High Z

0nA

1µA

VIL

VIH

(typical)

Where:

GDM = Differential Mode Gain

(V/V)

VCM = Op Amp’s Common-Mode

Input Voltage

(V)

VOST = Op Amp’s Total Input

Offset Voltage

(mV)

-------

-----------

-------------------------

OST

IN-

IN+

–

OUT

-----------V

–

 V

OST 1GDM



VDD

VOUT

CB2

CB1

10 k



10 k



VDD/2

10 k



10 k



20 pF



2.2 µF

100 nF

VIN-

VIN+

6.8 pF

MCP66X

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