ST7LUS5 datasheet(101/124 Pages) STMICROELECTRONICS

101 / 124 page

ST7LUS5, ST7LU05, ST7LU09

Electrical characteristics

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Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Software recommendations:

The software flowchart must include the management of runaway conditions such as:

●

Corrupted program counter

●

Unexpected reset

●

Critical Data corruption (control registers...)

Prequalification trials:

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the RESET pin or the oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring (see application note AN1015).

Table 75.

EMS test results

Symbol

Parameter

Conditions

Level/

Class

VFESD

Voltage limits to be applied on any I/O

pin to induce a functional disturbance

VDD = 5V, TA = +25°C, fOSC = 8 MHz,

SO8 package,

conforms to IEC 1000-4-2

VFFTB

Fast transient voltage burst limits to be

applied through 100pF on VDD and VDD

pins to induce a functional disturbance

VDD =5V, TA = +25°C, fOSC =8MHz,

SO8 package,

conforms to IEC 1000-4-4

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