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OPTION_REG Datasheet(PDF) 55 Page - Microchip Technology |
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OPTION_REG Datasheet(HTML) 55 Page - Microchip Technology |
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55 / 222 page ![]() 2013 Microchip Technology Inc. DS22331A-page 55 MCP19111 8.0 SYSTEM BENCH TESTING To allow for easier system design and bench testing, the MCP19111 device features a multiplexer used to output various internal analog signals. These signals can be measured on the GPA0 pin through a unity gain buffer. The configuration control of the GPA0 pin is found in the ATSTCON register, as shown in Register 8-1. Control of the signals present at the output of the unity gain buffer is found in the BUFFCON register, as shown in Register 8-2. 8.1 Analog Bench Test Control 8.1.1 ATSTCON REGISTER The ATSTCON register contains the bits used to dis- able the MOSFET drivers and configure the GPA0 pin as the unity gain buffer out, as shown in Register 8-1. Note 1: The DRVDIS bit is reset to ‘1’ so the high- side and low-side drivers are in a known state after reset. This bit must be cleared by software for normal operation. REGISTER 8-1: ATSTCON: ANALOG BENCH TEST CONTROL REGISTER R/W-1 U-0 U-0 U-0 R/W-0 R/W-0 R/W-0 R/W-1 Reserved — — Reserved HIDIS LODIS BNCHEN DRVDIS bit 7 bit 0 Legend: R = Readable bit W = Writable bit U = Unimplemented bit, read as ‘0’ -n = Value at POR ‘1’ = Bit is set ‘0’ = Bit is cleared x = Bit is unknown bit 7 Reserved bit 6-5 Unimplemented: Read as ‘0’ bit 4 Reserved bit 3 HIDIS: High-side driver control bit 1 = High-side driver is disabled 0 = High-side driver is enabled bit 2 LODIS: Low-side driver control bit 1 = Low-side driver is disabled 0 = low-side driver is enabled bit 1 BNCHEN: GPA0 bench test configuration control bit 1 = GPA0 is configured for analog bench test output 0 = GPA0 is configured for normal operation bit 0 DRVDIS: MOSFET driver disable control bit 1 = High-side and low-side drivers are set low, PHASE pin is floating 0 = High-side and low-side drivers are set for normal operation |
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