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NL17SG373 Datasheet(PDF) 2 Page - ON Semiconductor

Part # NL17SG373
Description  Low-Power D-Type Low-Power D-Type
PDF  10 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NL17SG373 Datasheet(HTML) 2 Page - ON Semiconductor

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NL17SG373
www.onsemi.com
2
FUNCTION TABLE
Input
Internal Latch
Output
Operating Mode
OE
LE
D
Q
L
H
L
L
L
Enable and Read Register
L
H
H
H
H
(Transparent Mode)
L
L
X
L
L
Latch and Read Register
L
L
X
H
H
H
X
X
X
Z
Latch Register and Disable Output
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
−0.5 to +5.5
V
VIN
DC Input Voltage
−0.5 to +5.5
V
VOUT
DC Output Voltage
−0.5 to VCC + 0.5
V
IIK
DC Input Diode Current VIN < GND
−50
mA
IOK
DC Output Diode Current VOUT < GND, VOUT > VCC
±50
mA
IO
DC Output Source/Sink Current
±20
mA
ICC
DC Supply Current Per Supply Pin
±50
mA
IGND
DC Ground Current per Ground Pin
±50
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
260
°C
TJ
Junction Temperature Under Bias
150
°C
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage Human Body Mode (Note 2)
Machine Model (Note 3)
> 3000
> 200
V
ILATCHUP
Latchup Performance Above VCC and Below GND at 125°C (Note 4)
±100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
2. Tested to EIA / JESD22−A114−A.
3. Tested to EIA / JESD22−A115−A.
4. Tested to EIA / JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
Positive DC Supply Voltage
0.9
3.6
V
VIN
Digital Input Voltage
0
3.6
V
VOUT
Output Voltage Active Mode
0
VCC
V
TA
Operating Free−Air Temperature
−55
+125
°C
Dt / DV
Input Transition Rise or Fail Rate VCC = 3.3 V ± 0.3 V
0
10
nS/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.



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