SPC564A80L7 datasheet(22/157 Pages) STMICROELECTRONICS

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Introduction

SPC564A74L7, SPC564A80B4, SPC564A80L7

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Doc ID 15399 Rev 9

include differential inputs; integrated variable gain amplifiers for increasing the dynamic

range; programmable pull-up and pull-down resistors for biasing and sensor diagnostics.

The eQADC also integrates a programmable decimation filter capable of taking in ADC

conversion results at a high rate, passing them through a hardware low pass filter, then

down-sampling the output of the filter and feeding the lower sample rate results to the result

FIFOs. This allows the ADCs to sample the sensor at a rate high enough to avoid aliasing of

out-of-band noise; while providing a reduced sample rate output to minimize the amount

DSP processing bandwidth required to fully process the digitized waveform.

The eQADC provides the following features:

●

Dual on-chip ADCs

–2

 12-bit ADC resolution

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Programmable resolution for increased conversion speed (12-bit, 10-bit, 8-bit)

12-bit conversion time: 938 ns (1 M sample/sec)

10-bit conversion time: 813 ns (1.2 M sample/second)

8-bit conversion time: 688 ns (1.4 M sample/second)

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Up to 10-bit accuracy at 500 KSample/s and 8-bit accuracy at 1 MSample/s

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Differential conversions

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Single-ended signal range from 0 to 5 V

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Variable gain amplifiers on differential inputs (

1, 2, 4)

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Sample times of 2 (default), 8, 64 or 128 ADC clock cycles

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Provides time stamp information when requested

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Allows time stamp information relative to eTPU clock sources, such as an angle

clock

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Parallel interface to eQADC CFIFOs and RFIFOs

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Supports both right-justified unsigned and signed formats for conversion results

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40 single-ended input channels, expandable to 56 channels with external multiplexers

(supports four external 8-to-1 muxes)

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8 channels can be used as 4 pairs of differential analog input channels

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Differential channels include variable gain amplifier for improved dynamic range

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Differential channels include programmable pull-up and pull-down resistors for biasing

and sensor diagnostics (200 k

100 k5k

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Additional internal channels for monitoring voltages (such as core voltage, I/O voltage,

LVI voltages, etc.) inside the device

●

An internal bandgap reference to allow absolute voltage measurements

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Silicon die temperature sensor

–

Provides temperature of silicon as an analog value

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Read using an internal ADC analog channel

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May be read with either ADC

●

2 Decimation Filters

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Programmable decimation factor (1 to 16)

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Selectable IIR or FIR filter

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Up to 4th order IIR or 8th order FIR

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Programmable coefficients

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