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SPEAR1340 Datasheet(PDF) 177 Page - STMicroelectronics |
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SPEAR1340 Datasheet(HTML) 177 Page - STMicroelectronics |
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177 / 200 page ![]() SPEAr1340 Timing characteristics Doc ID 023063 Rev 4 177/200 Figure 37. ADDR/CTRLsignals timing waveform Write DQS timing characteristics The DDR3 SDRAM supports a write-leveling feature to allow the controller to compensate the skew between the mem_clk and the data strobe (DQS) at each memory cut. During the write leveling phase, the controller uses the feedback from the DDR3 SDRAM to adjust the DQS to mem_clk relationship. The DQS delay established through this procedure helps to ensure tDQSS specifications in systems using a fly-by topology by deskewing the trace length mismatch. Based on the 8-phase PHY architecture, the DQS signal is derived from one of the eight dll_clocks, so it is adjustable with a minimum step of 1/8 of the clock period (max_error). The sampled value coming from the memory is processed so that the tDQSS value can vary from 0 to 1/8 Tclk (see Figure 38). For the DDR2 you have to find the right alignment without the write-leveling support. Figure 38. DQS strobe timing waveform Write DQ/DM timing characteristics Similar to the creation of the write DQS signal, the write DQ/DM signals are created through a clock derived from one of the eight dll_clocks. The clock generating DQ/DM signals should always be set two phases before the clock generating DQS. This would ensure a 90-degree phase difference between DQ and DQS. Due to the path delay difference between DQ and DQS, the maximum error respect to the ideal case is one phase off, so the max error is 1/8 Tclk. The maximum skew among the DQ/DM signals in a single data slice is about 30 ps. For a frequency of 533.3 MHz, the period of the clock is TCLK= 1.875 ns. mem_clk ADDR/CTRL max error max error Ts Th skew skew mem_clk DQS tDQSS |
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