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ADDR10 Datasheet(PDF) 20 Page - List of Unclassifed Manufacturers |
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ADDR10 Datasheet(HTML) 20 Page - List of Unclassifed Manufacturers |
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20 / 68 page ![]() System mod e (test supp ort) 16 NS 75 20 Da ta shee t 03 /2 00 6 System mode (test support) PLLTST_, BISTEN_, and SCANEN_ primary inputs control different test modes for both functional and manufacturing test operations (see Table 3: "NS7520 test modes" on page 22). JTAG test JTAG boundary scan allows a tester to check the soldering of all signal pins and tri-state all outputs. ARM debugger signal descriptions Symbol Pin I/O OD Description PLLTST_ N15 I Encoded with BISTEN_ and SCANEN_ Add an external pullup to 3.3V or pulldown to GND. BISTEN_ M15 I Encoded with PLLTST_ and SCANEN_ Add an external pullup to 3.3V or pulldown to GND. SCANEN_ L13 I Encoded with BISTEN_ and PLLTST_ Add an external pullup to 3.3V or pulldown to GND. Symbol Pin I/O OD Description TDI N14 U I Test data in. TDO M13 O 2 Test data out. TMS M12 U I Test mode select. TRST_ M14 I Test mode reset. Requires external termination when not being used (see Figure 3, "TRST_ termination," on page 17 for an illustration of the termination circuit on the development PCB). TCK P15 I Test mode clock. Add an external pullup to 3.3V. Mnemonic Signal Description TDI Test data in TDI operates the JTAG standard. Consult the JTAG specifications for use in boundary-scan testing. These signals meet the requirements of the Raven and Jeeni debuggers. TDO Test data out TDO operates the JTAG standard. Consult the JTAG specifications for use in boundary-scan testing. These signals meet the requirements of the Raven and Jeeni debuggers. TMS Test mode select TMS operates the JTAG standard. Consult the JTAG specifications for use in boundary-scan testing. These signals meet the requirements of the Raven and Jeeni debuggers. |
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