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ADDR10 Datasheet(PDF) 20 Page - List of Unclassifed Manufacturers

Part # ADDR10
Description  Figure 1 shows the NS7520 modules. Dashed lines indicate shared pins
PDF  68 Pages
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Manufacturer  ETC2 [List of Unclassifed Manufacturers]
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System mod e (test supp ort)
16
NS 75 20 Da ta shee t
03 /2 00 6
System mode (test support)
PLLTST_, BISTEN_, and SCANEN_ primary inputs control different test modes for both functional
and manufacturing test operations (see Table 3: "NS7520 test modes" on page 22).
JTAG test
JTAG boundary scan allows a tester to check the soldering of all signal pins and tri-state all
outputs.
ARM debugger signal descriptions
Symbol
Pin
I/O
OD
Description
PLLTST_
N15
I
Encoded with BISTEN_ and SCANEN_
Add an external pullup to 3.3V or pulldown to GND.
BISTEN_
M15
I
Encoded with PLLTST_ and SCANEN_
Add an external pullup to 3.3V or pulldown to GND.
SCANEN_
L13
I
Encoded with BISTEN_ and PLLTST_
Add an external pullup to 3.3V or pulldown to GND.
Symbol
Pin
I/O
OD
Description
TDI
N14 U
I
Test data in.
TDO
M13
O
2
Test data out.
TMS
M12 U
I
Test mode select.
TRST_
M14
I
Test mode reset.
Requires external termination when not being used (see
Figure 3, "TRST_ termination," on page 17 for an
illustration of the termination circuit on the development
PCB).
TCK
P15
I
Test mode clock.
Add an external pullup to 3.3V.
Mnemonic
Signal
Description
TDI
Test data in
TDI operates the JTAG standard. Consult the JTAG specifications
for use in boundary-scan testing. These signals meet the
requirements of the Raven and Jeeni debuggers.
TDO
Test data out
TDO operates the JTAG standard. Consult the JTAG specifications
for use in boundary-scan testing. These signals meet the
requirements of the Raven and Jeeni debuggers.
TMS
Test mode select
TMS operates the JTAG standard. Consult the JTAG specifications
for use in boundary-scan testing. These signals meet the
requirements of the Raven and Jeeni debuggers.



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