MB9BF412RPMC-G-JNE2 datasheet(45/112 Pages) CYPRESS

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Document Number: 002-05615 Rev. *D

Page

45 of 112

MB9B410R Series

Handling Precautions

Any semiconductor devices have inherently a certain rate of failure. The possibility of failure is greatly affected by the conditions in

which they are used (circuit conditions, environmental conditions, etc.). This page describes precautions that must be observed to

minimize the chance of failure and to obtain higher reliability from your Cypress semiconductor devices.

6.1

Precautions for Product Design

This section describes precautions when designing electronic equipment using semiconductor devices.

Absolute Maximum Ratings

Semiconductor devices can be permanently damaged by application of stress (voltage, current, temperature, etc.) in excess of

certain established limits, called absolute maximum ratings. Do not exceed these ratings.

Recommended Operating Conditions

Recommended operating conditions are normal operating ranges for the semiconductor device. All the device's electrical

characteristics are warranted when operated within these ranges.

Always use semiconductor devices within the recommended operating conditions. Operation outside these ranges may adversely

affect reliability and could result in device failure.

No warranty is made with respect to uses, operating conditions, or combinations not represented on the data sheet. Users

considering application outside the listed conditions are advised to contact their sales representative beforehand.

Processing and Protection of Pins

These precautions must be followed when handling the pins which connect semiconductor devices to power supply and

input/output functions.

Preventing Over-Voltage and Over-Current Conditions

Exposure to voltage or current levels in excess of maximum ratings at any pin is likely to cause deterioration within the

device, and in extreme cases leads to permanent damage of the device. Try to prevent such overvoltage or over-current

conditions at the design stage.

Protection of Output Pins

Shorting of output pins to supply pins or other output pins, or connection to large capacitance can cause large current flows.

Such conditions if present for extended periods of time can damage the device.

Therefore, avoid this type of connection.

Handling of Unused Input Pins

Unconnected input pins with very high impedance levels can adversely affect stability of operation. Such pins should be

connected through an appropriate resistance to a power supply pin or ground pin.

Latch-up

Semiconductor devices are constructed by the formation of P-type and N-type areas on a substrate. When subjected to

abnormally high voltages, internal parasitic PNPN junctions (called thyristor structures) may be formed, causing large current

levels in excess of several hundred mA to flow continuously at the power supply pin. This condition is called latch-up.

CAUTION: The occurrence of latch-up not only causes loss of reliability in the semiconductor device, but can cause injury or

damage from high heat, smoke or flame. To prevent this from happening, do the following:

Be sure that voltages applied to pins do not exceed the absolute maximum ratings. This should include attention to abnormal

noise, surge levels, etc.

Be sure that abnormal current flows do not occur during the power-on sequence.

MB9BF412RPMC-G-JNE2 Datasheet(PDF) 45 Page - Cypress Semiconductor

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